A Study on the Standards for Xe Analysis by Wavelength Dispersive X-ray Spectrometer (WDS) of Electron Probe Micro Analysis (EPMA)

Park, Soon Dal; 박순달; Ha, Young Kyeung; 하영경; Kim, Jong Goo; 김종구; Jee, Kwang Young; 지광용; Kim, Won Ho; 김원호

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P-ISSN1225-0163
E-ISSN2288-8985
SCOPUS, ESCI, KCI

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P-ISSN 1225-0163
E-ISSN 2288-8985

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Vol.13, No.5

PubReader Citation

A Study on the Standards for Xe Analysis by Wavelength Dispersive X-ray Spectrometer (WDS) of Electron Probe Micro Analysis (EPMA)

Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985

2000, v.13 no.5, pp.565-572

Park, Soon Dal
Ha, Young Kyeung
Kim, Jong Goo
Jee, Kwang Young
Kim, Won Ho

Park, S. D., Ha, Y. K., Kim, J. G., Jee, K. Y., & Kim, W. H. (2000). A Study on the Standards for Xe Analysis by Wavelength Dispersive X-ray Spectrometer (WDS) of Electron Probe Micro Analysis (EPMA). , 13(5), 565-572.

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Abstract

In this paper it was described on the standards for Xe analysis by Wavelength Dispersive X-ray Spectrometer (WDS) of Electron Probe Micro Analyser. According to the experimental results, CsI and $BaCO_3$ are appropriate compounds as standard specimen for Cs, I and Ba which has not suitable pure metal standards. In the beam current of 10-30 nA range, the Cs x-ray intensity measured from CsBr and CsI was proportional to the beam current. It was found that the linear regression factor R, showing the linearity between the atomic number and x-ray intensity between In and Nd elements, was higher than 0.99 at 25 kV and PET crystal. The caJlculated x-ray intensity of Xe standard from this linear regression equation was 1.095 times higher than that ofTe at 25 kV.