Journal of Science and Science Education

  • P-ISSN3022-8719

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Vol.49, No.2
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X-ray Reflectivity and Electron Density of films

Journal of Science and Science Education / Journal of Science and Science Education, (P)3022-8719;
2024, v.49 no.2, pp.75-82
https://doi.org/10.23335/JSSE.2024.49.2.75

(2024). X-ray Reflectivity and Electron Density of films. , 49(2), 75-82, https://doi.org/10.23335/JSSE.2024.49.2.75
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Abstract

Smooth surfaces reflect waves, including X-rays and neutrons. By measuring the reflectivities of these waves, it is possible to quantitatively determine the mean thickness, mean densities of scattering sources (such as electrons and atomic nuclei), and mean surface roughness of films. The refractive indices of X-rays and neutrons differ for vacuum and matter, with the former being one and the latter being less than one. Consequently, when X-rays and neutrons transition from air to a film, they undergo perfect reflection by the film surface if the incident angle between the beam and film surface is below a critical angle. This critical angle is influenced by the mean density of the scattering sources within the film. By quantitatively analyzing reflectivity as a function of the incident angle, it is possible to ascertain the mean density of scattering sources throughout the depth of the film.

keywords
Reflectivity, X-ray, Film, Interface, Electron Density


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